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"On broad-side delay test."

Jacob Savir, Srinivas Patil (1994)

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DOI: 10.1109/92.311647

access: closed

type: Journal Article

metadata version: 2020-03-11

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Jacob Savir, Srinivas Patil:
On broad-side delay test. IEEE Trans. Very Large Scale Integr. Syst. 2(3): 368-372 (1994)

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