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"Improving the Reliability of MLC NAND Flash Memories Through Adaptive Data ..."

Chengen Yang et al. (2014)

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DOI: 10.1007/S11265-014-0880-5

access: closed

type: Journal Article

metadata version: 2020-03-12

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  - https://dblp.org/rec/journals/vlsisp/YangCMC14
Chengen Yang, Hsing Min Chen, Trevor N. Mudge, Chaitali Chakrabarti:
Improving the Reliability of MLC NAND Flash Memories Through Adaptive Data Refresh and Error Control Coding. J. Signal Process. Syst. 76(3): 225-234 (2014)

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