"Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing ..."

Chang Cai et al. (2020)

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DOI: 10.1109/ACCESS.2020.2978201

access: open

type: Journal Article

metadata version: 2020-04-16

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Chang Cai, Ze He, Tianqi Liu, Gengsheng Chen, Jian Yu, Liewei Xu, Jie Liu:
Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing Circuits. IEEE Access 8: 45378-45389 (2020)

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