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"High Accuracy Profile Measurement With a New Virtual Multi-Probe Scanning ..."

Ning Chai, Ziqiang Yin, Jianhua Yao (2020)

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DOI: 10.1109/ACCESS.2020.3020571

access: open

type: Journal Article

metadata version: 2022-10-11

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  - https://dblp.org/rec/journals/access/ChaiYY20
Ning Chai, Ziqiang Yin, Jianhua Yao:
High Accuracy Profile Measurement With a New Virtual Multi-Probe Scanning System. IEEE Access 8: 158727-158734 (2020)

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