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"High Accuracy Profile Measurement With a New Virtual Multi-Probe Scanning ..."
Ning Chai, Ziqiang Yin, Jianhua Yao (2020)
- Ning Chai
, Ziqiang Yin
, Jianhua Yao
:
High Accuracy Profile Measurement With a New Virtual Multi-Probe Scanning System. IEEE Access 8: 158727-158734 (2020)
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