"A Non-Blocking Non-Degrading Multiple Defects Link Testing Method for ..."

Khanh N. Dang et al. (2020)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2020.2982836

access: open

type: Journal Article

metadata version: 2020-05-04

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/DangMAAT20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/DangMAAT20
Khanh N. Dang, Michael Conrad Meyer, Akram Ben Ahmed, Abderazek Ben Abdallah, Xuan-Tu Tran:
A Non-Blocking Non-Degrading Multiple Defects Link Testing Method for 3D-Networks-on-Chip. IEEE Access 8: 59571-59589 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.