"A Deep Learning-Based Approach for the Detection of Infested Soybean Leaves."

Niklas Farah et al. (2023)

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DOI: 10.1109/ACCESS.2023.3313978

access: open

type: Journal Article

metadata version: 2023-10-14

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Niklas Farah, Nicolas Drack, Hannah Dawel, Ricardo Buettner:
A Deep Learning-Based Approach for the Detection of Infested Soybean Leaves. IEEE Access 11: 99670-99679 (2023)

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