"Lifetime Prediction of Current-and Temperature-Induced Degradation in ..."

Alexander Herzog et al. (2023)

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DOI: 10.1109/ACCESS.2023.3249478

access: open

type: Journal Article

metadata version: 2023-03-11

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Alexander Herzog, Simon Benkner, Babak Zandi, Matteo Buffolo, Willem D. van Driel, Matteo Meneghini, Tran Quoc Khanh:
Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes. IEEE Access 11: 19928-19940 (2023)

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