"Propagation and Masking Characteristics of Errors During Software Testing ..."

Young-Mi Kim et al. (2024)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2024.3469729

access: open

type: Journal Article

metadata version: 2024-11-06

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/KimCYP24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/KimCYP24
Young-Mi Kim, Jin-Young Choi, Seunghoon Yoo, Myunghwan Park:
Propagation and Masking Characteristics of Errors During Software Testing in Synchronous Programming. IEEE Access 12: 146009-146021 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.