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"Concurrent and Robust End-to-End Data Integrity Verification Scheme for ..."

Hwajung Kim et al. (2022)

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DOI: 10.1109/ACCESS.2022.3163729

access: open

type: Journal Article

metadata version: 2022-04-27

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Hwajung Kim, Inhwi Hwang, Jeongeun Lee, Heon Y. Yeom, Hanul Sung:
Concurrent and Robust End-to-End Data Integrity Verification Scheme for Flash-Based Storage Devices. IEEE Access 10: 36350-36361 (2022)

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