"Influence of Hole Current Crowding on Snapback Breakdown in Multi-Finger ..."

Siyoun Lee et al. (2023)

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DOI: 10.1109/ACCESS.2023.3285614

access: open

type: Journal Article

metadata version: 2023-07-07

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Siyoun Lee, Seong-Yeon Kim, Haesoon Oh, Jaesung Sim, Woo Young Choi:
Influence of Hole Current Crowding on Snapback Breakdown in Multi-Finger MOSFETs. IEEE Access 11: 60758-60762 (2023)

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