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ORCID"On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug."
Hayoung Lee, Hyunggoy Oh, Sungho Kang (2021)
- Hayoung Lee
, Hyunggoy Oh, Sungho Kang:
On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug. IEEE Access 9: 56443-56456 (2021)
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