"A Fast Method for Reliability Evaluation of Ultra High Voltage AC/DC ..."

Yan Li et al. (2018)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2018.2817247

access: open

type: Journal Article

metadata version: 2018-07-04

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/LiYLZTC18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/LiYLZTC18
Yan Li, Shun Yuan, Weiming Liu, Guoli Zhang, Yun Teng, Xiaolu Chen:
A Fast Method for Reliability Evaluation of Ultra High Voltage AC/DC System Based on Hybrid Simulation. IEEE Access 6: 19151-19160 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.