"Numerical and Experimental Analysis of Potential Causes Degrading Contact ..."

Jangmuk Lim et al. (2019)

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DOI: 10.1109/ACCESS.2019.2939377

access: open

type: Journal Article

metadata version: 2019-10-19

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Jangmuk Lim, Hansu Kim, Jae Kyun Kim, Sung Joon Park, Tae Hee Lee, Sang Won Yoon:
Numerical and Experimental Analysis of Potential Causes Degrading Contact Resistances and Forces of Sensor Connectors for Vehicles. IEEE Access 7: 126530-126538 (2019)

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