"Wafer Region Yield Prediction: Employing Majority Under-Sampling and ..."

Martin Ying Song Lim, Anurag Sharma, Cheng Siong Chin (2025)

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DOI: 10.1109/ACCESS.2025.3554525

access: open

type: Journal Article

metadata version: 2025-05-09

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Martin Ying Song Lim, Anurag Sharma, Cheng Siong Chin:
Wafer Region Yield Prediction: Employing Majority Under-Sampling and Output Binarization on Low-Yield Threshold. IEEE Access 13: 55104-55112 (2025)

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