"A Transient Conducted EM Disturbances Source Modeling Method for ..."

Bailin Mou et al. (2024)

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DOI: 10.1109/ACCESS.2024.3521284

access: open

type: Journal Article

metadata version: 2025-01-08

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Bailin Mou, Qifeng Liu, Zhenya Chen, Xiaowen Wu, Yongming Li, Chen Huang, Huaiqing Zhang:
A Transient Conducted EM Disturbances Source Modeling Method for Electromagnetic Launch System Based on the Cascaded Multi-Port Circuit Model. IEEE Access 12: 195085-195096 (2024)

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