"Electrical Characterization by Counter-Doped Pocket Design in Tunnel FETs."

Ki Ryung Nam, Kwang Soo Kim, Woo Young Choi (2023)

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DOI: 10.1109/ACCESS.2023.3262285

access: open

type: Journal Article

metadata version: 2023-04-29

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Ki Ryung Nam, Kwang Soo Kim, Woo Young Choi:
Electrical Characterization by Counter-Doped Pocket Design in Tunnel FETs. IEEE Access 11: 30546-30554 (2023)

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