"GAN-Based Framework for Unified Estimation of Process-Induced Random ..."

Taeeon Park et al. (2022)

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DOI: 10.1109/ACCESS.2022.3228552

access: open

type: Journal Article

metadata version: 2023-01-15

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Taeeon Park, Jihwan Kwak, Hongjoon Ahn, Jinwoong Lee, Jaehyuk Lim, Sangho Yu, Changhwan Shin, Taesup Moon:
GAN-Based Framework for Unified Estimation of Process-Induced Random Variation in FinFET. IEEE Access 10: 130001-130023 (2022)

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