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"S-TAT Leakage Current in Partial Isolation Type Saddle-FinFET (Pi-FinFET)s."

Jin Hyo Park et al. (2021)

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DOI: 10.1109/ACCESS.2021.3102687

access: open

type: Journal Article

metadata version: 2022-06-23

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Jin Hyo Park, Geon Kim, Dong Yeong Kim, Su Yeon Kim, Sunyong Yoo, Myoung Jin Lee:
S-TAT Leakage Current in Partial Isolation Type Saddle-FinFET (Pi-FinFET)s. IEEE Access 9: 111567-111575 (2021)

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