"Monte Carlo Simulation-Based Method for Evaluating Sample Thickness ..."

Keon-Hee Park et al. (2025)

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DOI: 10.1109/ACCESS.2025.3583892

access: open

type: Journal Article

metadata version: 2025-08-09

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Keon-Hee Park, Seung-Won Lee, Hae-Jong Kim, Jang-Seob Lim:
Monte Carlo Simulation-Based Method for Evaluating Sample Thickness Variation to Improve Reliability of Dielectric Strength Assessment. IEEE Access 13: 113005-113012 (2025)

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