"Secure Scan Architecture for Enhanced Testability and Resistance Against ..."

A. Swetha Priya, S. Kamatchi, E. Lakshmi Prasad (2025)

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DOI: 10.1109/ACCESS.2025.3575442

access: open

type: Journal Article

metadata version: 2025-07-06

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A. Swetha Priya, S. Kamatchi, E. Lakshmi Prasad:
Secure Scan Architecture for Enhanced Testability and Resistance Against Side-Channel Attacks in Cryptographic ICs. IEEE Access 13: 98837-98846 (2025)

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