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"Wafer Defect Localization and Classification Using Deep Learning Techniques."
Prashant P. Shinde, Priyadarshini P. Pai, Shashishekar P. Adiga (2022)
- Prashant P. Shinde, Priyadarshini P. Pai, Shashishekar P. Adiga:
Wafer Defect Localization and Classification Using Deep Learning Techniques. IEEE Access 10: 39969-39974 (2022)
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