"Unsupervised Pre-Training of Imbalanced Data for Identification of Wafer ..."

Ho-Sun Shon et al. (2021)

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DOI: 10.1109/ACCESS.2021.3068378

access: open

type: Journal Article

metadata version: 2021-04-29

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Ho-Sun Shon, Erdenebileg Batbaatar, Wan-Sup Cho, Seong Gon Choi:
Unsupervised Pre-Training of Imbalanced Data for Identification of Wafer Map Defect Patterns. IEEE Access 9: 52352-52363 (2021)

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