"Improvement of Erase Performance Using p-Type Gate in IGZO Channel-Based ..."

Minkyo Suh, Youngho Jung, Daewoong Kang (2025)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2025.3537994

access: open

type: Journal Article

metadata version: 2025-03-07

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/SuhJK25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/SuhJK25
Minkyo Suh, Youngho Jung, Daewoong Kang:
Improvement of Erase Performance Using p-Type Gate in IGZO Channel-Based 3D NAND Flash. IEEE Access 13: 32237-32247 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.