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"IETCR: An Information Entropy Based Test Case Reduction Strategy for ..."
Haifeng Wang et al. (2020)
- Haifeng Wang, Bin Du, Jie He, Yong Liu, Xiang Chen:
IETCR: An Information Entropy Based Test Case Reduction Strategy for Mutation-Based Fault Localization. IEEE Access 8: 124297-124310 (2020)
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