"Transient Electromagnetic Disturbance Induced on the Ports of Intelligent ..."

Heng-Tian Wu et al. (2017)

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DOI: 10.1109/ACCESS.2017.2695490

access: open

type: Journal Article

metadata version: 2018-07-04

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Heng-Tian Wu, Chong-Qing Jiao, Xiang Cui, Xiao-Fan Liu, Jian-Fei Ji:
Transient Electromagnetic Disturbance Induced on the Ports of Intelligent Component of Electronic Instrument Transformer Due to Switching Operations in 500 kV GIS Substations. IEEE Access 5: 5104-5112 (2017)

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