"An Effective Method to Compensate for Testing Induced SBFET Degradation by ..."

Tiexin Zhang et al. (2025)

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DOI: 10.1109/ACCESS.2025.3573406

access: open

type: Journal Article

metadata version: 2025-07-06

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Tiexin Zhang, Fanyu Liu, Lei Shu, Siyuan Chen, Yuchong Wang, Yuchen Wu, Jing Wan, Yong Xu, Shi Li, Yuyang Ding, Bo Li, Zhengsheng Han, Tian-Chun Ye:
An Effective Method to Compensate for Testing Induced SBFET Degradation by Charging Deep-Level Interface Trap. IEEE Access 13: 93481-93490 (2025)

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