"A Transient Bulging Phenomenon in Fast Doping Processes for p-n Junctions."

Jihong Zhang, Tienmo Shih (2020)

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DOI: 10.1109/ACCESS.2020.3007486

access: open

type: Journal Article

metadata version: 2020-07-31

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Jihong Zhang, Tienmo Shih:
A Transient Bulging Phenomenon in Fast Doping Processes for p-n Junctions. IEEE Access 8: 126523-126529 (2020)

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