"Yield and reliability issues in nanoelectronic technologies."

Denis Teixeira Franco, Jean-François Naviner, Lirida A. B. Naviner (2006)

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DOI: 10.1007/BF03219903

access: closed

type: Journal Article

metadata version: 2022-10-02

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Denis Teixeira Franco, Jean-François Naviner, Lirida A. B. Naviner:
Yield and reliability issues in nanoelectronic technologies. Ann. des Télécommunications 61(11-12): 1422-1457 (2006)

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