"Using patent data for technology forecasting: China RFID patent analysis."

Charles V. Trappey et al. (2011)

> Home

Details and statistics

DOI: 10.1016/J.AEI.2010.05.007

access: closed

type: Journal Article

metadata version: 2020-02-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/aei/TrappeyWTT11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/aei/TrappeyWTT11
Charles V. Trappey, Hsin-Ying Wu, Fataneh Taghaboni-Dutta, Amy J. C. Trappey:
Using patent data for technology forecasting: China RFID patent analysis. Adv. Eng. Informatics 25(1): 53-64 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.