"Hardness of k-LWE and Applications in Traitor Tracing."

San Ling et al. (2017)

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DOI: 10.1007/S00453-016-0251-7

access: closed

type: Journal Article

metadata version: 2025-03-03

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San Ling, Duong Hieu Phan, Damien Stehlé, Ron Steinfeld:
Hardness of k-LWE and Applications in Traitor Tracing. Algorithmica 79(4): 1318-1352 (2017)

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