"Stochastic re-entrant line modeling for an environment stress testing in a ..."

Suresh Kumar, Mohamed Khaled Omar (2006)

> Home

Details and statistics

DOI: 10.1016/J.AMC.2005.04.050

access: closed

type: Journal Article

metadata version: 2020-02-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/amc/KumarO06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/amc/KumarO06
Suresh Kumar, Mohamed Khaled Omar:
Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry. Appl. Math. Comput. 173(1): 603-615 (2006)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.