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"Semiconductor chip's quality analysis based on its high dimensional test data."

Sun Kai, Wu Jin (2022)

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DOI: 10.1007/S10479-019-03240-Z

access: open

type: Journal Article

metadata version: 2022-05-13

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  dblp key:
  - journals/anor/KaiJ22
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  - https://dblp.org/rec/journals/anor/KaiJ22
Sun Kai, Wu Jin:
Semiconductor chip's quality analysis based on its high dimensional test data. Ann. Oper. Res. 311(1): 183-194 (2022)

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