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"Rule-based data mining for yield improvement in semiconductor manufacturing."

Sholom M. Weiss et al. (2010)

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DOI: 10.1007/s10489-009-0168-9

access: closed

type: Journal Article

metadata version: 2017-05-17

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  - journals/apin/WeissBTCDSH10
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  - https://dblp.org/rec/journals/apin/WeissBTCDSH10
Sholom M. Weiss, Robert J. Baseman, Fateh Tipu, Christopher N. Collins, William A. Davies, Raminderpal Singh, John W. Hopkins:
Rule-based data mining for yield improvement in semiconductor manufacturing. Appl. Intell. 33(3): 318-329 (2010)

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