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"Defect detection on new samples with siamese defect-aware attention network."

Ye Zheng, Li Cui (2023)

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DOI: 10.1007/S10489-022-03595-0

access: closed

type: Journal Article

metadata version: 2023-02-10

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  dblp key:
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  - https://dblp.org/rec/journals/apin/ZhengC23
Ye Zheng, Li Cui:
Defect detection on new samples with siamese defect-aware attention network. Appl. Intell. 53(4): 4563-4578 (2023)

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