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"Optimal scale Gaussian process regression model in Insulated Gate Bipolar ..."

Ling-Ling Li et al. (2019)

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DOI: 10.1016/J.ASOC.2019.02.035

access: closed

type: Journal Article

metadata version: 2020-12-04

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Ling-Ling Li, Xin-Bao Zhang, Ming-Lang Tseng, Ya-Tong Zhou:
Optimal scale Gaussian process regression model in Insulated Gate Bipolar Transistor remaining life prediction. Appl. Soft Comput. 78: 261-273 (2019)

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