"Robust weakly supervised product surface defect segmentation based on ..."

Rui Yan et al. (2025)

> Home

Details and statistics

DOI: 10.1016/J.ASOC.2025.113661

access: closed

type: Journal Article

metadata version: 2025-10-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/asc/YanWYW25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/asc/YanWYW25
Rui Yan, Xiaojun Wu, Qixun Yang, Michael Yu Wang:
Robust weakly supervised product surface defect segmentation based on guided cropping and inpainting extension. Appl. Soft Comput. 184: 113661 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.