"Standardization and modularization driven by minimizing overall process ..."

Yuval Sered, Yoram Reich (2006)

> Home

Details and statistics

DOI: 10.1016/J.CAD.2005.11.005

access: closed

type: Journal Article

metadata version: 2020-02-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/cad/SeredR06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/cad/SeredR06
Yuval Sered, Yoram Reich:
Standardization and modularization driven by minimizing overall process effort. Comput. Aided Des. 38(5): 405-416 (2006)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.