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"Extensions of the witness method to characterize under-, over- and ..."
Simon E. B. Thierry et al. (2011)
- Simon E. B. Thierry, Pascal Schreck, Dominique Michelucci, Christoph Fünfzig, Jean-David Génevaux:
Extensions of the witness method to characterize under-, over- and well-constrained geometric constraint systems. Comput. Aided Des. 43(10): 1234-1249 (2011)
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