"Power Profiling of Modern Die-Stacked Memory."

Dylan C. Stow et al. (2019)

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DOI: 10.1109/LCA.2019.2941715

access: closed

type: Journal Article

metadata version: 2020-08-26

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  - https://dblp.org/rec/journals/cal/StowFGIX19
Dylan C. Stow, Amin Farmahini Farahani, Sudhanva Gurumurthi, Michael Ignatowski, Yuan Xie:
Power Profiling of Modern Die-Stacked Memory. IEEE Comput. Archit. Lett. 18(2): 132-135 (2019)

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