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"An oversampling method for wafer map defect pattern classification ..."

Eun-Su Kim et al. (2021)

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DOI: 10.1016/J.CIE.2021.107767

access: closed

type: Journal Article

metadata version: 2022-10-02

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  - https://dblp.org/rec/journals/candie/KimCLKBO21
Eun-Su Kim, Seung-Hyun Choi, Dong-Hee Lee, Kwang-Jae Kim, Young-Mok Bae, Young-Chan Oh:
An oversampling method for wafer map defect pattern classification considering small and imbalanced data. Comput. Ind. Eng. 162: 107767 (2021)

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