"Denoising variational autoencoders for smart inspection of wafer probe ..."

Butsayarin Suwattananuruk, Chen Fu Chien (2025)

> Home

Details and statistics

DOI: 10.1016/J.CIE.2025.111453

access: closed

type: Journal Article

metadata version: 2025-09-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/candie/SuwattananurukC25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/candie/SuwattananurukC25
Butsayarin Suwattananuruk, Chen Fu Chien:
Denoising variational autoencoders for smart inspection of wafer probe card PCB channels for advancing quality control for semiconductor manufacturing. Comput. Ind. Eng. 209: 111453 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.