"Nondestructive high-throughput sugar beet fruit analysis using X-ray CT ..."

Tim Van De Looverbosch et al. (2022)

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DOI: 10.1016/J.COMPAG.2022.107228

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type: Journal Article

metadata version: 2025-05-01

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Tim Van De Looverbosch, Bert Vandenbussche, Pieter Verboven, Bart M. Nicolaï:
Nondestructive high-throughput sugar beet fruit analysis using X-ray CT and deep learning. Comput. Electron. Agric. 200: 107228 (2022)

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