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"Sensitivity analysis of wheat yield based on growing degree days in ..."

Jincheng Zhou et al. (2023)

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DOI: 10.1016/J.COMPAG.2023.107876

access: closed

type: Journal Article

metadata version: 2023-07-07

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  - https://dblp.org/rec/journals/cea/ZhouWKMB23
Jincheng Zhou, Dan Wang, Sayna Nezhad Kheirollah, Saman Maroufpoor, Shahab S. Band:
Sensitivity analysis of wheat yield based on growing degree days in different growth stages: Application of machine learning approach enhanced by grey systems theory. Comput. Electron. Agric. 210: 107876 (2023)

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