"Derivation of test set for detecting multiple missing-gate faults in ..."

Dipak Kumar Kole et al. (2013)

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DOI: 10.1016/J.COMPELECENG.2012.11.016

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type: Journal Article

metadata version: 2020-02-19

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Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya:
Derivation of test set for detecting multiple missing-gate faults in reversible circuits. Comput. Electr. Eng. 39(2): 225-236 (2013)

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