"A new test suite reduction method for wearable embedded software."

Qing Shen, Yunliang Jiang, Jungang Lou (2017)

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DOI: 10.1016/J.COMPELECENG.2017.06.017

access: closed

type: Journal Article

metadata version: 2023-03-21

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Qing Shen, Yunliang Jiang, Jungang Lou:
A new test suite reduction method for wearable embedded software. Comput. Electr. Eng. 61: 116-125 (2017)

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