"Gate conduction mechanisms and high Vth stability of Cu-gated p-GaN HEMT."

Mao Jia et al. (2025)

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DOI: 10.1007/S11432-024-4343-5

access: closed

type: Journal Article

metadata version: 2025-05-03

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Mao Jia, Bin Hou, Ling Yang, Meng Zhang, Mei Wu, Hao Lu, Xitong Hong, Zhiqiang Xue, Jiale Du, Qingyuan Chang, Qian Xiao, Xiaohua Ma, Yue Hao:
Gate conduction mechanisms and high Vth stability of Cu-gated p-GaN HEMT. Sci. China Inf. Sci. 68(5) (2025)

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