Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Industrial process fault detection based on locally linear embedded latent ..."

Yuan Li, Chengcheng Feng (2022)

> Home

Details and statistics

DOI: 10.1007/S11432-019-2896-X

access: closed

type: Journal Article

metadata version: 2022-04-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/chinaf/LiF22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/chinaf/LiF22
Yuan Li, Chengcheng Feng:
Industrial process fault detection based on locally linear embedded latent mapping. Sci. China Inf. Sci. 65(4) (2022)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.