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"Test Generation Algorithm for Fault Detection of Analog Circuits Based on ..."

Jingyu Zhou et al. (2014)

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DOI: 10.1155/2014/740838

access: open

type: Journal Article

metadata version: 2020-03-12

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Jingyu Zhou, Shulin Tian, Chenglin Yang, Xuelong Ren:
Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine. Comput. Intell. Neurosci. 2014: 740838:1-740838:11 (2014)

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