"Structural RFIC device testing through built-in thermal monitoring."

Josep Altet et al. (2003)

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DOI: 10.1109/MCOM.2003.1232243

access: closed

type: Journal Article

metadata version: 2021-11-10

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Josep Altet, Antonio J. Rubio, José Luis Rosselló, Jaume Segura:
Structural RFIC device testing through built-in thermal monitoring. IEEE Commun. Mag. 41(9): 98-104 (2003)

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