"A Study on Sample Size Sensitivity of Factory Manufacturing Dataset for ..."

Dongbock Kim et al. (2022)

> Home

Details and statistics

DOI: 10.3390/COMPUTATION10080142

access: open

type: Journal Article

metadata version: 2022-10-02

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/computation/KimSYS22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/computation/KimSYS22
Dongbock Kim, Sat Byul Seo, NamHyun Yoo, Gisu Shin:
A Study on Sample Size Sensitivity of Factory Manufacturing Dataset for CNN-Based Defective Product Classification. Comput. 10(8): 142 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.